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Technical Committee on Reliability (R)  (Searched in: 2017)

Search Results: Keywords 'from:2017-11-16 to:2017-11-16'
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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2017-11-16
14:00		 Osaka   A Study for Accelerated Humidity Stress Test
Sadanori Ito (Itoken) R2017-50		 The humidity stress against electronics used in Japan cause the big influence for reliability. So, the humidity stress r... [more] R2017-50
pp.1-4
R 2017-11-16
14:25		 Osaka   The Electrochemical Migration Test Using Condensation Cycle Test
Takaaki Semba, Katsuyuki Ishizu, Takafumi Fujisawa (MMC) R2017-51		 (To be available after the conference date) [more] R2017-51
pp.5-8
R 2017-11-16
14:50		 Osaka   The study of Acceleration model Based on the Step Stress test
Toshinari Matsuoka (Mitsubishi Electric) R2017-52		  [more] R2017-52
pp.9-12
R 2017-11-16
15:30		 Osaka   Effects on Stresses in HALT
Raphael Pihet, Takuya Hirata, Hideki Kawai, Aoki Yuichi (ESPEC) R2017-53		 HALT (Highly Accelerated Limit Test) is an accelerated test which, by applying severe stresses, can identify the relativ... [more] R2017-53
pp.13-16
R 2017-11-16
15:55		 Osaka   Weak Points Detection of Products by Multiple Power Cycling Test
katsuyuki Ishizu (MMC), Hiroaki Nishikawa (KMM) R2017-54		 In order to prevent product failure in markets, it is important to detect weak points of products at the early stage of ... [more] R2017-54
pp.17-20
R 2017-11-16
16:20		 Osaka   Bayesian Reliability Analysis Based on Degradation Data
Toru Kaise (Univ. of Hyogo) R2017-55		  [more] R2017-55
pp.21-24
 Results 1 - 6 of 6  /   
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