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| Chair |
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Tetsushi Yuge (National Defense Academy) |
| Vice Chair |
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Akira Asato (Fujitsu) |
| Secretary |
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Nobuyuki Tamura (Hosei Univ.), Shigeto Hiraguri (RTRI) |
| Assistant |
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Shinji Inoue (Kansai Univ.), Hiroyuki Okamura (Hiroshima Univ.) |
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|
|
| Chair |
|
Yoshiteru Abe (NTT) |
| Secretary |
|
Yuichi Hayashi (NAIST), Masato Mizukami (Muroran Inst. of Tech.) |
| Assistant |
|
Yoshiki Kayano (Univ. of Electro-Comm.) |
|
| Conference Date |
Fri, Feb 16, 2018 13:30 - 15:25 |
| Topics |
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| Conference Place |
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| Sponsors |
This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Electronics Packaging Society, IEEE Reliability Society Japan Chapter.
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Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Feb 16 PM
13:30 - 15:25 |
| (1) |
13:30-13:55 |
Friction and Contact Resisatnce of Tin Plated Contacts with Lubricant  R2017-61 EMD2017-53 |
Atsushi Shimizu, Yasushi Saitoh (AutoNetworks Tech.) |
| (2) |
13:55-14:20 |
Influence of Wear Load on Fretting Corrosion Behavior of Silver Plating Films on Copper Alloys Plates R2017-62 EMD2017-54 |
Song-zhu Kure-chu (Nagoya Inst. of Tech.), Nobuhiro Kawakami (Iwate Univ.), Yongda YE (Nagoya Inst. of Tech.), Hitoshi Yashiro (Iwate Univ.), Kingo Furukawa, Yasushi Saitoh (AutoNetworks Tech.), Tomoyuki Sakata (SWS) |
| |
14:20-14:35 |
Break ( 15 min. ) |
| (3) |
14:35-15:00 |
Terminal Plating to Lower the Insertion Force of Multiway Connectors R2017-63 EMD2017-55 |
Akihiro Katoh (AutoNetworks Tech.), Hajime Watanabe (SWS), Yoshifumi Saka, Kingo Furukawa, Yasushi Saitoh (AutoNetworks Tech.), Tomoyuki Sakata (SWS) |
| (4) |
15:00-15:25 |
Simultaneous Observation of Break Arcs from Two Directions by High Speed Cameras when a 48VDC/270A resistive circuit is interrupted R2017-64 EMD2017-56 |
Ryuichi Takano, Junya Sekikawa (Shizuoka Univ.) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| R |
Technical Committee on Reliability (R) [Latest Schedule]
|
| Contact Address |
Hiroyuki Okamura (Hiroshima Univ.)
E- :     l     -u |
| EMD |
Technical Committee on Electromechanical Devices (EMD) [Latest Schedule]
|
| Contact Address |
Yoshiteru Abe(NTT)
TEL +81-29-868-6129，FAX +81-29-868-6142
E-: abe     
Yuichi Hayashi(NAIST)
TEL +81-743-72-5390，FAX +81-743-72-5391
E-:  -i is ist
Masato Mizukami(Muroran Institute of Technology)
TEL&FAX +81-143-46-5307
E-: m-   mmm n-it
Yoshiki Kayano(Univ. of Electro-Comm.)
TEL&FAX +81-42-443-5233
E-: y   c |
| Announcement |
Latest information will be presented on the homepage:
http://www.ieice.org/es/emd/jpn/ |
Last modified: 2018-02-08 14:14:15
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