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Technical Committee on Reliability (R) (Searched in: 2017)
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Search Results: Keywords 'from:2017-11-16 to:2017-11-16'
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[Go to Official R Homepage (Japanese)] |
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
R |
2017-11-16 14:00 |
Osaka |
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A Study for Accelerated Humidity Stress Test Sadanori Ito (Itoken) R2017-50 |
The humidity stress against electronics used in Japan cause the big influence for reliability. So, the humidity stress r... [more] |
R2017-50 pp.1-4 |
R |
2017-11-16 14:25 |
Osaka |
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The Electrochemical Migration Test Using Condensation Cycle Test Takaaki Semba, Katsuyuki Ishizu, Takafumi Fujisawa (MMC) R2017-51 |
(To be available after the conference date) [more] |
R2017-51 pp.5-8 |
R |
2017-11-16 14:50 |
Osaka |
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The study of Acceleration model Based on the Step Stress test Toshinari Matsuoka (Mitsubishi Electric) R2017-52 |
[more] |
R2017-52 pp.9-12 |
R |
2017-11-16 15:30 |
Osaka |
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Effects on Stresses in HALT Raphael Pihet, Takuya Hirata, Hideki Kawai, Aoki Yuichi (ESPEC) R2017-53 |
HALT (Highly Accelerated Limit Test) is an accelerated test which, by applying severe stresses, can identify the relativ... [more] |
R2017-53 pp.13-16 |
R |
2017-11-16 15:55 |
Osaka |
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Weak Points Detection of Products by Multiple Power Cycling Test katsuyuki Ishizu (MMC), Hiroaki Nishikawa (KMM) R2017-54 |
In order to prevent product failure in markets, it is important to detect weak points of products at the early stage of ... [more] |
R2017-54 pp.17-20 |
R |
2017-11-16 16:20 |
Osaka |
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Bayesian Reliability Analysis Based on Degradation Data Toru Kaise (Univ. of Hyogo) R2017-55 |
[more] |
R2017-55 pp.21-24 |
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