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| Chair |
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Mitsuhiro Kimura (Hosei Univ.) |
| Vice Chair |
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Hiroyasu Mawatari (NTT) |
| Secretary |
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Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.) |
| Assistant |
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Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.) |
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| Conference Date |
Fri, Jun 13, 2014 13:30 - 15:35 |
| Topics |
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| Conference Place |
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| Sponsors |
This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan.
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Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Jun 13 PM
13:30 - 15:35 |
| (1) |
13:30-13:55 |
3-Variate Software Testing-Progress Assessment Model Based on A Gaussian Copula  R2014-9 |
Mitsuhiro Kimura, Kotaro Ueda (Hosei Univ.) |
| (2) |
13:55-14:20 |
A Note on Maximum Penalized Likelihood Estimation for Phase-Type Distributions R2014-10 |
Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.) |
| (3) |
14:20-14:45 |
Improvement idea of SA algorithms for optimal arrangement problem in a Multi-state k-out-of-n:F system R2014-11 |
Naoki Yoshida, Hisashi Yamamoto (Tokyo Metropolitan University), Koji Shingyochi (Jumonji Univ.), Tomoaki Akiba (Chiba Inst. of Tech.), Xiao Xiao (Tokyo Metropolitan University) |
| (4) |
14:45-15:10 |
Failure Probability of a k-out-n System Considering Common-cause Failures R2014-12 |
Tetsushi Yuge, Shigeru Yanagi (NDA) |
| (5) |
15:10-15:35 |
Copper bonding technology using low-temperature decomposition compound R2014-13 |
Daisuke Horikawa, Atsushi Yamamoto, Yuji Hisazato, Yo Sasaki, Rieko Mizuuchi (Toshiba) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| R |
Technical Committee on Reliability (R) [Latest Schedule]
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| Contact Address |
Akira Asato (FUJITSU)
E- : a         |
Last modified: 2014-04-16 20:46:26
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