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Technical Committee on Electromechanical Devices (EMD) (Searched in: 2020)
Search Results: Keywords 'from:2020-12-04 to:2020-12-04'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD | 2020-12-04 13:05 |
Online | Online | Observation of arc discharges occurring between commutator and brush Simulating a DC motor by means of a high-speed camera Ryosuke Sano, Junya Sekikawa (Shizuoka Univ.)  EMD2020-18 |
Observed results of arc discharges generated between the brush and commutator are reported during arc duration. The arcs... [more] | EMD2020-18 pp.1-6 |
| EMD | 2020-12-04 13:30 |
Online | Online | Dependence of arc duration and contact gap at arc extinction of break arcs occurring in a 48VDC/10A-300A resistive circuit on contact opening speed Haruko Yazaki, Junya Sekikawa (Shizuoka Univ.) EMD2020-19 |
[more] | EMD2020-19 pp.7-12 |
| EMD | 2020-12-04 13:55 |
Online | Online | An Extraordinary Long Lifetime Case of AgPd Brush and Au-plated Slip-ring System with Lubricant Koichiro Sawa, Yositada Watanabe, Takahiro Ueno (NIT), Hiroyasu Masubuchi (NIDEC SERVO) EMD2020-20 |
[more] | EMD2020-20 pp.13-18 |
| EMD | 2020-12-04 14:35 |
Online | Online | Sliding energization characteristics of copper contacts by molybdenum disulfide shot treatment Tatsuro Iizuka, Yoshitada Watanabe, Koichiro Sawa, Takahiro Ueno (NIT) EMD2020-21 |
[more] | EMD2020-21 pp.19-23 |
| EMD | 2020-12-04 15:00 |
Online | Online | Sliding Current Characteristics brought about by Changes in the Silver Content of Silver Graphite Brushes. Naoki Fukuda, Ryosuke Kudo, Yuki Saito, Yuki Kawashima, Yusuke Takada, Koichiro Sawa, Takahiro Ueno (NIT) EMD2020-22 |
Sliding contact is a mechanism for the transfer of electrical current between stationary and moving parts. To date, slip... [more] | EMD2020-22 pp.24-29 |
| EMD | 2020-12-04 15:25 |
Online | Online | Analysis of HDMI Mated Connector Electrical Performance Impacts on a Signal Integrity of the High-speed Digital System Kim Youngwoo (NAIST) EMD2020-23 |
[more] | EMD2020-23 pp.30-33 |
| EMD | 2020-12-04 15:50 |
Online | Online | Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation Hiroyuki Ueda, Shugo Kaji, Youngwoo Kim, Daisuke Fujimoto (NAIST), Taiki Kitazawa, Takashi Kasuga (NIT,Nagano College)), Yuichi Hayashi (NAIST) EMD2020-24 |
As the operating frequency of information devices increases, the noise generated by the device is also becoming broadban... [more] | EMD2020-24 pp.34-38 |
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