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Technical Committee on Integrated Circuits and Devices (ICD) (Searched in: 2023)
Search Results: Keywords 'from:2023-08-01 to:2023-08-01'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SDM, ICD, ITE-IST [detail] | 2023-08-03 11:10 |
Hokkaido | Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
Stabilizing Variable Filters Using Inverse Trigonometric Functions Tian-Bo Deng (Toho Univ.) |
Digital-signal-processing (DSP) applications require a digital filter to change its frequency responses in a timely mann... [more] | |
| SDM, ICD, ITE-IST [detail] | 2023-08-03 11:35 |
Hokkaido | Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
A method for analyzing chlorophyll-a concentration in the seawater surface layer by image hue analysis. Shunya Kosako, Toshihiko Hamasaki (HIT) |
[more] | |
| SDM, ICD, ITE-IST [detail] | 2023-08-03 13:00 |
Hokkaido | Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
[Invited Talk]
Energy Field, Computer Shape Noriyuki Miura (Osaka Univ.)  SDM2023-50 ICD2023-29 |
[more] | SDM2023-50 ICD2023-29 pp.62-63 |
| SDM, ICD, ITE-IST [detail] | 2023-08-03 13:45 |
Hokkaido | Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
[Invited Talk]
Load Adaptive Active Gate Driver Integrated Circuit for Power Device Shusuke Kawai, Takeshi Ueno, Satoshi Takaya, Koutaro Miyazaki (Toshiba), Kohei Onizuka (Toshiba Europe Limited), Hiroaki Ishihara (Toshiba) SDM2023-51 ICD2023-30 |
[more] | SDM2023-51 ICD2023-30 pp.64-69 |
| SDM, ICD, ITE-IST [detail] | 2023-08-03 14:40 |
Hokkaido | Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
Real-Time Gate Current Change Gate Driver IC to Adapt to Operating Condition Variations of SiC MOSFETs Dibo Zhang, Kohei Horii, Katsuhiro Hata, Makoto Takamiya (UTokyo) SDM2023-52 ICD2023-31 |
A digital gate driver IC with real-time gate current (IG) change by sensing drain current (ID) is applied to SiC MOSFETs... [more] | SDM2023-52 ICD2023-31 pp.70-73 |
| SDM, ICD, ITE-IST [detail] | 2023-08-03 15:05 |
Hokkaido | Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
Gate Driver IC with Fully Integrated Overcurrent Protection Function by Measuring Gate-to-Emitter Voltage Haifeng Zhang, Dibo Zhang, Hiromu Yamasaki, Katsuhiro Hata (Univ. of Tokyo), Keiji Wada (Tokyo Metropolitan Univ.), Kan Akatsu (Yokohama National Univ.), Ichiro Omura (Kyusyu Institute of Technology), Makoto Takamiya (Univ. of Tokyo) SDM2023-53 ICD2023-32 |
[more] | SDM2023-53 ICD2023-32 pp.74-78 |
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