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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2015-12-01
15:45		 Nagasaki Nagasaki Kinro Fukushi Kaikan [Fellow Memorial Lecture] Improving System Dependability by VLSI Test Technology
Seiji Kajihara (KIT) VLD2015-44 CPM2015-128 ICD2015-53 CPSY2015-64 DC2015-40 RECONF2015-51		 VLSI Test technology for detection of manufacturing faults has been developed to improve test quality that is the capabi... [more] VLD2015-44 CPM2015-128 ICD2015-53 CPSY2015-64 DC2015-40 RECONF2015-51
pp.43-44(VLD), pp.9-10(CPM), pp.9-10(ICD), pp.19-20(CPSY), pp.43-44(DC), pp.19-20(RECONF)
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