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Committee Date Time Place Paper Title / Authors Abstract Paper #
LQE, ED, CPM 2023-11-30
14:55		 Shizuoka   Two-dimensional characterization of Au/Ni/thin heavily-Mg-doped p-GaN/n-GaN Schottky contacts under applied voltage by scanning internal photoemission microscopy
Haruto Yoshimura, Hiroki Imabayashi (Fukui univ.), Fumimasa Horikiri, Yoshinobu Narita, Hajime Fujikura (Sumitomo Chem.), Hiroshi Ohta, Tomoyoshi Mishima (Hosei Univ.), Kenji Shiojima (Fukui univ.) ED2023-18 CPM2023-60 LQE2023-58		 We applied scanning internal photoemission microscopy (SIPM) method to clarify the two-dimensional basic characteristics... [more] ED2023-18 CPM2023-60 LQE2023-58
pp.21-24
CPM, ED, LQE 2022-11-24
14:15		 Aichi Winc Aichi (Aichi Industry & Labor Center)
(Primary: On-site, Secondary: Online)		 Two-dimensional characterization of the edge structure of Ni/n-GaN Schottky contacts under applied voltage by scanning internal photoemission microscopy
Hiroki Imabayashi (Univ. of Fukui), Fumimasa Horikiri, Yoshinobu Narita, Noboru Fukuhara (Sumitomo Chemical Co, Ltd.), Tomoyoshi Mishima (Hosei Univ.), Kenji Shiojima (Univ. of Fukui) ED2022-33 CPM2022-58 LQE2022-66		  [more] ED2022-33 CPM2022-58 LQE2022-66
pp.45-48
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