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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD |
2010-03-10 16:15 |
Okinawa |
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An efficient technique to search failure-areas for yield estimation via partial hyperspherephere Takanori Date, Shiho Hagiwara, Kazuya Masu (Tokyo Inst. of Tech.), Takashi Sato (Kyoto Univ.) VLD2009-105 |
Monte Carlo simulations have been widely adopted for analyzing circuit properties, such as SRAM yield,
under strong inf... [more] |
VLD2009-105 pp.37-42 |
VLD, IPSJ-SLDM |
2009-05-21 10:25 |
Fukuoka |
Kitakyushu International Conference Center |
Importance sampling with two-phase preprocess considering structural symmetry of SRAM circuits Takanori Date, Shiho Hagiwara, Takumi Uezono (Tokyo Inst. of Tech.), Takashi Sato (Kyoto Univ.), Kazuya Masu (Tokyo Inst. of Tech.) VLD2009-5 |
The influence of process variation on SRAM yield has become a serious consern in scaled technologies.
Monte Carlo-based... [more] |
VLD2009-5 pp.37-42 |
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