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Paper Abstract and Keywords
Presentation 2010-03-10 16:15
An efficient technique to search failure-areas for yield estimation via partial hyperspherephere
Takanori Date, Shiho Hagiwara, Kazuya Masu (Tokyo Inst. of Tech.), Takashi Sato (Kyoto Univ.) VLD2009-105
Abstract (in Japanese) (See Japanese page) 
(in English) Monte Carlo simulations have been widely adopted for analyzing circuit properties, such as SRAM yield,
under strong influence of process variations. Enormous calculation time is required in such a simulation due to the
low failure probabilities. In this paper, we propose a robust shift vector determination for mean shift importance
sampling, by which efficiency and stability of the Monte Carlo simulation is improved. In the proposed technique,
the sampling region on a hypersphere is first enlarged to find failure region, then the radius and region on the
hypersphere are reduced to find the points of the largest contributions. The optimal shift-vectors for mixture of
normal distributions are obtained without prior knowledge of the circuit structure. Simulation examples reveal that
the proposed technique stably and efficiently estimates yield for both read- and write-operation of SRAM cell. At
the failure probabilities of 10¡10, the number of Monte Carlo trials has been reduced by nine orders compared to a
vanilla Monte Carlo simulation.
Keyword (in Japanese) (See Japanese page) 
(in English) Monte Carlo method / Importance sampling / SRAM / pyield / gaussian mixture models / norm minimization / clustering / hypersphere  
Reference Info. IEICE Tech. Rep., vol. 109, no. 462, VLD2009-105, pp. 37-42, March 2010.
Paper # VLD2009-105 
Date of Issue 2010-03-03 (VLD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2009-105

Conference Information
Committee VLD  
Conference Date 2010-03-10 - 2010-03-12 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for System-on-Silicon 
Paper Information
Registration To VLD 
Conference Code 2010-03-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An efficient technique to search failure-areas for yield estimation via partial hyperspherephere 
Sub Title (in English)  
Keyword(1) Monte Carlo method  
Keyword(2) Importance sampling  
Keyword(3) SRAM  
Keyword(4) pyield  
Keyword(5) gaussian mixture models  
Keyword(6) norm minimization  
Keyword(7) clustering  
Keyword(8) hypersphere  
1st Author's Name Takanori Date  
1st Author's Affiliation Tokyo Institute of Technology (Tokyo Inst. of Tech.)
2nd Author's Name Shiho Hagiwara  
2nd Author's Affiliation Tokyo Institute of Technology (Tokyo Inst. of Tech.)
3rd Author's Name Kazuya Masu  
3rd Author's Affiliation Tokyo Institute of Technology (Tokyo Inst. of Tech.)
4th Author's Name Takashi Sato  
4th Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker Author-1 
Date Time 2010-03-10 16:15:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2009-105 
Volume (vol) vol.109 
Number (no) no.462 
Page pp.37-42 
#Pages 6 
Date of Issue 2010-03-03 (VLD) 

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