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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-07 11:20 |
Kumamoto |
Kumamoto-Kenminkouryukan Parea |
Design to Improve Open Defect Detection for Test Based on IDDT Appearance Time Ayumu Kambara, Kouhei Ohtani, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2017-49 DC2017-55 |
Increasing open defects has become a problem.
We proposed a supply current test method with a built-in sensor for dete... [more] |
VLD2017-49 DC2017-55 pp.125-130 |
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