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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, HWS, ICD 2024-02-29
14:25		 Okinawa
(Primary: On-site, Secondary: Online)		 Fundamental study on individual identification using electromagnetic characteristics unique to electronic devices
Tsuyoshi Kobayashi, Mio Akahori, Takahiro Horiguchi (Mitsubishi Electric) VLD2023-114 HWS2023-74 ICD2023-103		 Counterfeiting of electronic devices has become a problem, and research is being conducted on device authentication (PUF... [more] VLD2023-114 HWS2023-74 ICD2023-103
pp.89-93
HWS, ICD [detail] 2021-10-19
15:25		 Online Online Fundamental Study on Individual Identification of Printed Circuit Boards Using Capacitance Sensors
Ayaki Tachikake, Shugo Kaji, Daisuke Fujitomo, Yu-ichi Hayashi (NAIST) HWS2021-50 ICD2021-24		 Individual identification technology using Physical Unclonable Functions (PUFs) guarantees the authenticity of semicondu... [more] HWS2021-50 ICD2021-24
pp.49-52
HWS, VLD 2019-02-28
16:45		 Okinawa Okinawa Ken Seinen Kaikan Fundamental Study on Individual Identification Method of Electronic Device Using Difference of Radiation Spectrum Caused by Manufacturing/Mounting Variations
Shugo Kaji (NAIST), Masahiro kinugawa (NIT), Daisuke Fujimoto (NAIST), Laurent Sauvage, Jean-Luc Danger (Telecom ParisTech), Yu-ichi Hayashi (NAIST) VLD2018-120 HWS2018-83		 There is a possibility that electronic devices which contain counterfeited/cloned ICs or electronic components cause ser... [more] VLD2018-120 HWS2018-83
pp.163-167
ICD 2014-01-28
10:00		 Kyoto Kyoto Univ. Tokeidai Kinenkan [Invited Talk] Adaptive Performance Compensation with On-Chip Variation Monitoring
Masanori Hashimoto (Osaka Univ.) ICD2013-100		 This paper discusses adaptive performance control with two types of on-chip variation sensors. The first sensor
aims to... [more]		 ICD2013-100
pp.1-6
VLD 2009-03-13
11:05		 Okinawa   Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in Subthreshold Circuits
Hiroshi Fuketa, Masanori Hashimoto, Yukio Mitsuyama, Takao Onoye (Osaka Univ./JST-CREST) VLD2008-160		 This paper presents modeling of manufacturing variability and
body bias effect for subthreshold circuits
based on mea... [more]		 VLD2008-160
pp.201-206
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