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Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2017-11-16
15:55		 Osaka   Weak Points Detection of Products by Multiple Power Cycling Test
katsuyuki Ishizu (MMC), Hiroaki Nishikawa (KMM) R2017-54		 In order to prevent product failure in markets, it is important to detect weak points of products at the early stage of ... [more] R2017-54
pp.17-20
ICD, CPSY 2016-12-16
14:20		 Tokyo Tokyo Institute of Technology [Invited Talk] A Data-Driven Processor Realizing Trillion Sensors Universe
Hiroaki Nishikawa (Univ. of Tsukuba) ICD2016-96 CPSY2016-102		 This paper introduces a data-driven processor aiming at realizing Trillion Sensors Universe. Execution control scheme in... [more] ICD2016-96 CPSY2016-102
pp.139-144
US 2015-10-09
15:20		 Ishikawa Kanazawa Institute of Technology Quantitative measurement of polarity-inverted piezoelectric layer thickness using scanning nonlinear dielectric microscopy
Koshiro Terada, Hiroaki Nishikawa, Yohei Tanaka, Hiroyuki Odagawa (NIT, Kumamoto College), Takahiko Yanagitani (Waseda Univ.), Yasuo Cho (Tohoku Univ.) US2015-62		  [more] US2015-62
pp.23-26
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