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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-04 13:25 |
Kochi |
Kochi City Culture-Plaza |
A Test Compaction Oriented Don't Care Identification Method Motohiro Wakazono, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) VLD2009-62 DC2009-49 |
In recent year, the growing density and complexity for VLSIs cause an increase in the number of test pattern and an incr... [more] |
VLD2009-62 DC2009-49 pp.149-154 |
DC |
2009-02-16 15:20 |
Tokyo |
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A Method to Increase the Number of Don't care based on Easy- To-Detected Faults
-- Application for BAST Architecture -- LingLing Wan (Graduate Schoo of Nihon Univ.), Motohiro Wakazono (Graduate School of Nihon Univ.), Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) DC2008-76 |
The BIST Aided Scan Test (BAST) is a technique that combines the
automatic test pattern generator (ATPG) and the Built-... [more] |
DC2008-76 pp.49-54 |
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