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| Presentation | 2009-12-04 13:25 A Test Compaction Oriented Don't Care Identification Method Motohiro Wakazono, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.)  VLD2009-62 DC2009-49 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In recent year, the growing density and complexity for VLSIs cause an increase in the number of test pattern and an increase in the number of fault models to be tested high quality and low cost test pattern are required to solve there problems. One of test generation methods to get high quality and low cost test pattern is a don’t care identification technique. However, conventional don’t care identification techniques identity don’t care bits of specific primary inputs for specific test pattern. Therefore, it may have a bad influence an application specific fields like a test compaction. In this paper, we propose a test compaction oriented don’t care identification method which controls care bits in a test set. Experimental results for ITC’99 benchmark circuits and ISCAS’89 benchmark circuits show that a given test set can be efficiently compacted the proposed method. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | don't care identification / care bit bistribution / test compaction / essential fault / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 109, no. 316, DC2009-49, pp. 149-154, Dec. 2009. | |
| Paper # | DC2009-49 | |
| Date of Issue | 2009-11-25 (VLD, DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2009-62 DC2009-49 |
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| Conference Information | |
| Committee | VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
| Conference Date | 2009-12-02 - 2009-12-04 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kochi City Culture-Plaza |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2009 ―New Field of VLSI Design― |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2009-12-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Test Compaction Oriented Don't Care Identification Method |
| Sub Title (in English) | |
| Keyword(1) | don't care identification |
| Keyword(2) | care bit bistribution |
| Keyword(3) | test compaction |
| Keyword(4) | essential fault |
| Keyword(5) | |
| Keyword(6) | |
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| Keyword(8) | |
| 1st Author's Name | Motohiro Wakazono |
| 1st Author's Affiliation | Nihon University (Nihon Univ.) |
| 2nd Author's Name | Toshinori Hosokawa |
| 2nd Author's Affiliation | Nihon University (Nihon Univ.) |
| 3rd Author's Name | Masayoshi Yoshimura |
| 3rd Author's Affiliation | Kyushu University (Kyushu Univ.) |
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| Speaker | Author-1 |
| Date Time | 2009-12-04 13:25:00 |
| Presentation Time | 20 minutes |
| Registration for | DC |
| Paper # | VLD2009-62, DC2009-49 |
| Volume (vol) | vol.109 |
| Number (no) | no.315(VLD), no.316(DC) |
| Page | pp.149-154 |
| #Pages | 6 |
| Date of Issue | 2009-11-25 (VLD, DC) |
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