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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD 2017-03-02
09:50		 Okinawa Okinawa Seinen Kaikan Reliability enhancement of Hierarchical data reading circuit of Wafer scale mask ROM
Takaaki Yokoyama, Ochi Hiroyuki (Ritsumeikan Univ) VLD2016-110		 In the national libraries of developed countries, there is a demand to store large amounts of data in a digital form ove... [more] VLD2016-110
pp.49-54
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