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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2011-04-19
15:25		 Hyogo Kobe University Takigawa Memorial Hall Physical Analysis on ReRAM Filaments Using Atomic Force Microscope
Takatoshi Yoda (Tottori Univ.), Kentaro Kinoshita, Satoru Kishida (Tottori University/TEDREC), Toshiya Ogiwara, Hideo Iwai, Sei Fukushima, Shigeo Tanuma (NIMS) ICD2011-18		  [more] ICD2011-18
pp.99-104
SDM 2010-12-17
13:20		 Kyoto Kyoto Univ. (Katsura) [Invited Talk] Estimation of Physical Properties and Control of Memory Performance in ReRAM
Kentaro Kinoshita, Takatoshi Yoda, Hayato Tanaka, Akihiro Hanada, Satoru Kishida (Tottori Univ.) SDM2010-192		  [more] SDM2010-192
pp.39-44
SDM 2009-12-04
16:50		 Nara NAIST Mechanism elucidation of ReRAM by application of new analytical method
Tatsuya Makino, Kentaro Kinoshita, Kazufumi Doashi, Takatoshi Yoda, Satoru Kishida (Tottori Univ.) SDM2009-169		 We clarified that both HRS and LRS of the NiO film written by using conducting atomic force microscopy (C-AFM) can be di... [more] SDM2009-169
pp.93-96
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