|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, SDM |
2007-08-24 08:55 |
Hokkaido |
Kitami Institute of Technology |
Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variation in SoCs Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura (Kobe Univ.), Rei Akiyama (Renesas Design), Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata (Renesas Technology), Makoto Nagata (Kobe Univ.) SDM2007-156 ICD2007-84 |
Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring o... [more] |
SDM2007-156 ICD2007-84 pp.85-90 |
CAS, SIP, CS |
2006-03-06 15:30 |
Okinawa |
Univ of Ryukyu |
Buffer capacity evaluation of the bus using a memory bus SystemC model Kozo Ishida, Midori Ono, Osamu Toyama (Mitsubishi Electric Corp.), Tetsuya Kagemoto, MasayukiKoyama (Renesas Technology Corp.), Shiro Hosotani (Mitsubishi Electric Corp.) |
[more] |
CAS2005-116 SIP2005-162 CS2005-109 pp.117-121 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|