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Committee
Date Time
Place
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Abstract
Paper #
SDM
,
VLD
2006-09-26
16:15
Tokyo
Kikai-Shinko-Kaikan Bldg.
To be announced
Masami Hane
,
Takeo Ikezawa
,
Michihito Kawada
(
NEC
),
Tatsuya Ezaki
(
Hiroshima Univ.
),
Toyoji Yamamoto
(
MIRAI-ASET
)
Simulation analysis of channel-orientation effects on strained silicon MOSFETs based on a full-band Monte Carlo method c...
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VLD2006-50
SDM2006-171
pp.65-69
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