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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2013-02-13
16:15		 Tokyo Kikai-Shinko-Kaikan Bldg. Temperature and voltage estimation considering manufacturing variability for a monitoring circuit
Yousuke Miyake, Wataru Tsumori, Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech.), Yukiya Miura (Tokyo Metropolitan Univ.) DC2012-89		 Delay increase due to aging phenomena is a critical issue of VLSIs. For detecting such increase in field, a highly accur... [more] DC2012-89
pp.55-60
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2012-11-28
14:30		 Fukuoka Centennial Hall Kyushu University School of Medicine Design of temperature and voltage monitoring circuit structure for field test
Wataru Tsumori, Yousuke Miyake, Yasuo Sato, Seiji Kajihara (KIT), Yukiya Miura (TMU) VLD2012-101 DC2012-67		 For improving reliability of LSIs, the delay increase caused by aging during system operation should be detected before ... [more] VLD2012-101 DC2012-67
pp.243-248
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