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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
CPM, ICD |
2008-01-18 10:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board that Simulates Memory Module Yutaka Uematsu, Hideki Osaka (Hitachi), Yoji Nishio, Susumu Hatano (Elpida) CPM2007-139 ICD2007-150 |
Aiming to achieve double data rate-synchronous DRAM (DDR-SDRAM) at low-cost and with high noise tolerance by setting ade... [more] |
CPM2007-139 ICD2007-150 pp.65-69 |
ICD, CPM |
2005-09-08 09:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Development of Design Techniques for Semiconductor-Package By using Simplified DRAM Macro Model of Power System Satoshi Nakamura, Takashi Suga (Hitachi PERL), Mitsuaki Katagiri, Yoji Nishio, Seiji Funaba, Yukitoshi Hirose, イサ サトシ (Elpida) |
In late years, MCP(Multi Chip Package) and SiP(System in Package) which has plural semiconductor chips in one package be... [more] |
CPM2005-87 ICD2005-97 pp.13-18 |
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