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Paper Abstract and Keywords
Presentation 2008-01-18 10:30
A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board that Simulates Memory Module
Yutaka Uematsu, Hideki Osaka (Hitachi), Yoji Nishio, Susumu Hatano (Elpida) CPM2007-139 ICD2007-150
Abstract (in Japanese) (See Japanese page) 
(in English) Aiming to achieve double data rate-synchronous DRAM (DDR-SDRAM) at low-cost and with high noise tolerance by setting adequate Vref target impedance, we have inserted a low pass filter (LPF) in the Vref line of DRAM chip. To demonstrate this LPF effect, we have established a measurement setup for Vref noise tolerance of DDR2-SDRAM on test board simulating actual memory module. The measured Vref noise tolerance has strong frequency-dependency; the higher the frequency, the larger the noise tolerance. We believe that this is because of the LPF consisted in the test chip.
Keyword (in Japanese) (See Japanese page) 
(in English) DDR-SDRAM / Vref / Noise Tolerance / Noise Sensitivity Measurement / Target Impedance / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 425, CPM2007-139, pp. 65-69, Jan. 2008.
Paper # CPM2007-139 
Date of Issue 2008-01-10 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPM2007-139 ICD2007-150

Conference Information
Committee CPM ICD  
Conference Date 2008-01-17 - 2008-01-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To CPM 
Conference Code 2008-01-CPM-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board that Simulates Memory Module 
Sub Title (in English)  
Keyword(1) DDR-SDRAM  
Keyword(2) Vref  
Keyword(3) Noise Tolerance  
Keyword(4) Noise Sensitivity Measurement  
Keyword(5) Target Impedance  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yutaka Uematsu  
1st Author's Affiliation Central Research Laboratory, Hitachi Ltd. (Hitachi)
2nd Author's Name Hideki Osaka  
2nd Author's Affiliation Central Research Laboratory, Hitachi Ltd. (Hitachi)
3rd Author's Name Yoji Nishio  
3rd Author's Affiliation Elpida Memory Inc, (Elpida)
4th Author's Name Susumu Hatano  
4th Author's Affiliation Elpida Memory Inc, (Elpida)
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Speaker Author-1 
Date Time 2008-01-18 10:30:00 
Presentation Time 25 minutes 
Registration for CPM 
Paper # CPM2007-139, ICD2007-150 
Volume (vol) vol.107 
Number (no) no.425(CPM), no.426(ICD) 
Page pp.65-69 
#Pages 5 
Date of Issue 2008-01-10 (CPM, ICD) 

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