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| Presentation | 2008-01-18 10:30 A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board that Simulates Memory Module Yutaka Uematsu, Hideki Osaka (Hitachi), Yoji Nishio, Susumu Hatano (Elpida)  CPM2007-139 ICD2007-150 Link to ES Tech. Rep. Archives: CPM2007-139 ICD2007-150 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Aiming to achieve double data rate-synchronous DRAM (DDR-SDRAM) at low-cost and with high noise tolerance by setting adequate Vref target impedance, we have inserted a low pass filter (LPF) in the Vref line of DRAM chip. To demonstrate this LPF effect, we have established a measurement setup for Vref noise tolerance of DDR2-SDRAM on test board simulating actual memory module. The measured Vref noise tolerance has strong frequency-dependency; the higher the frequency, the larger the noise tolerance. We believe that this is because of the LPF consisted in the test chip. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | DDR-SDRAM / Vref / Noise Tolerance / Noise Sensitivity Measurement / Target Impedance / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 107, no. 425, CPM2007-139, pp. 65-69, Jan. 2008. | |
| Paper # | CPM2007-139 | |
| Date of Issue | 2008-01-10 (CPM, ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | CPM2007-139 ICD2007-150 Link to ES Tech. Rep. Archives: CPM2007-139 ICD2007-150 |
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| Conference Information | |
| Committee | CPM ICD |
| Conference Date | 2008-01-17 - 2008-01-18 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | CPM |
| Conference Code | 2008-01-CPM-ICD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board that Simulates Memory Module |
| Sub Title (in English) | |
| Keyword(1) | DDR-SDRAM |
| Keyword(2) | Vref |
| Keyword(3) | Noise Tolerance |
| Keyword(4) | Noise Sensitivity Measurement |
| Keyword(5) | Target Impedance |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Yutaka Uematsu |
| 1st Author's Affiliation | Central Research Laboratory, Hitachi Ltd. (Hitachi) |
| 2nd Author's Name | Hideki Osaka |
| 2nd Author's Affiliation | Central Research Laboratory, Hitachi Ltd. (Hitachi) |
| 3rd Author's Name | Yoji Nishio |
| 3rd Author's Affiliation | Elpida Memory Inc, (Elpida) |
| 4th Author's Name | Susumu Hatano |
| 4th Author's Affiliation | Elpida Memory Inc, (Elpida) |
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| Speaker | Author-1 |
| Date Time | 2008-01-18 10:30:00 |
| Presentation Time | 25 minutes |
| Registration for | CPM |
| Paper # | CPM2007-139, ICD2007-150 |
| Volume (vol) | vol.107 |
| Number (no) | no.425(CPM), no.426(ICD) |
| Page | pp.65-69 |
| #Pages | 5 |
| Date of Issue | 2008-01-10 (CPM, ICD) |
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