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Committee Date Time Place Paper Title / Authors Abstract Paper #
MW 2016-12-15
17:20		 Kanagawa National Defense Academy Investigation of indirect S parameter estimation when the number of ports of measurement and the number of ports of the circuit to be measured are different
Yuuya Kojima, Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) MW2016-152		 An advantage of obtaining the S parameter of the device under test by indirect measurement via fixture is that the groun... [more] MW2016-152
pp.113-117
EMCJ, IEE-EMC, MW, EST [detail] 2016-10-21
14:30		 Miyagi Tohoku Univ. S-parameter estimation method for multi-port circuit using T parameters of fixture -- the number of ports of the measurement and multi-port circuit is not equal --
Yuuya Kojima, Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) EMCJ2016-80 MW2016-112 EST2016-76		 A method estimating S-parameters of n-port circuit connected to (m+n)-port fixture is described. Especially
the case wh... [more]		 EMCJ2016-80 MW2016-112 EST2016-76
pp.119-124
MW 2016-06-24
12:30		 Gifu Gifu Univ. Multi-port S-parameter estimation method considering reciprocity of connection circuit
Yuuya Kojima, Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) MW2016-33		  [more] MW2016-33
pp.15-20
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