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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2016-04-15
10:20
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] Highly Reliable Method for Long-Term Semiconductor Data Storage
Tomonori Takahashi, Senju Yamazaki, Shuhei Tanakamaru, Tomoko Ogura Iwasaki, Shogo Hachiya, Ken Takeuchi (Chuo Univ.)
 [more]
ICD, CPSY 2015-12-17
16:00
Kyoto Kyoto Institute of Technology [Poster Presentation] Error Pattern Analysis of Long-Term Storage with NAND Flash Memory
Tomonori Takahashi, Senju Yamazaki, Ken Takeuchi (Chuo Univ.) ICD2015-77 CPSY2015-90
NAND flash memory has advantages of fast access speed and high density compared with other storage devices such as hard ... [more] ICD2015-77 CPSY2015-90
p.53
ICD 2015-04-16
15:15
Nagano   [Invited Talk] Reliability enhancement techniques of TLC NAND Flash Solid-State Drives (SSDs) for archive and enterprise applications
Shogo Hachiya, Shuhei Tanakamaru, Tsukasa Tokutomi, Masafumi Doi, Yuta Kitamura, Senju Yamazaki, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2015-5
 [more] ICD2015-5
pp.21-26
ICD, CPSY 2014-12-01
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. [Poster Presentation] Reliability Evaluation of Long-term Storage with NAND Flash Memories
Sakuya Suzuki, Senju Yamazaki, Ken Takeuchi (Chuo Univ.) ICD2014-86 CPSY2014-98
 [more] ICD2014-86 CPSY2014-98
p.51
ICD 2014-01-28
15:00
Kyoto Kyoto Univ. Tokeidai Kinenkan [Poster Presentation] An Optimum Asymmetric Coding in Each Number of PE Cycle for 1Xnm NAND Flash Memories
Senju Yamazaki (Chuo Univ), Shuhei Tanakamaru (Univ of Tokyo), Ken Takeuchi (Chuo Univ) ICD2013-106
The asymmetric coding increases the population of ‘1’s or ‘0’s in programming data to reduce bit errors, and thus reliab... [more] ICD2013-106
p.19
 Results 1 - 5 of 5  /   
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