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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SS |
2019-03-05 13:10 |
Okinawa |
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Attempt of ScreenTransition Test with Appropriate Granularity in Test Script Automatic Generation Toshiyuki Kurabayashi, Hiroyuki Kirinuki, Yu Yoshimura, Yu Adachi, Haruto Tanno (NTT) SS2018-75 |
(To be available after the conference date) [more] |
SS2018-75 pp.139-144 |
SS |
2019-03-05 13:35 |
Okinawa |
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Stepwise detection of image differences using screen elements in UI Layout Testing Yu Yoshimura, Yu Adachi, Haruto Tanno (NTT) SS2018-76 |
Methods for efficiently performing regression testing of software development have been proposed.
It is a method of ima... [more] |
SS2018-76 pp.145-150 |
AI |
2017-11-24 11:20 |
Fukuoka |
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AI2017-9 |
(To be available after the conference date) [more] |
AI2017-9 pp.13-18 |
AI, JSAI-KBS, JSAI-DOCMAS, JSAI-SAI, IPSJ-ICS |
2016-03-01 - 2016-03-04 |
Hokkaido |
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Decentralized area partitioning for a cooperative cleaning task with limited communication range Yu Yoshimura, Ayumi Sugiyama, Toshiharu Sugawara (waseda) AI2015-66 |
This paper proposes a method for decentralized area partitioning for
coordination for cleaning in an environment in whi... [more] |
AI2015-66 pp.7-12 |
ET |
2013-07-27 13:05 |
Kumamoto |
Kumamoto University |
Extraction of Individuality Using Handwriting Japanese Kanji for Examinee Authentication on e-Testing Yu Yoshimura (Tokyo Univ. of Science), Takehiro Furuta (Nara Univ. of Education), Takahito Tomoto, Takako Akakura (Tokyo Univ. of Science) ET2013-19 |
It is easy for examinees to cheating or spoofing during the e-Testing. To ensure fairness, it is necessary to prevent th... [more] |
ET2013-19 pp.1-6 |
DC, CPSY, IPSJ-SLDM, IPSJ-EMB |
2009-03-05 14:30 |
Niigata |
Sado Island Integrated Development Center |
SSEST4: Summer School on Embedded System Technologies 4 Hideki Takase (Nagoya Univ.), Taketo Yato (Kanagawa Univ.), Tatsuhiro Oikawa (Tokai Polytechnic College), Eiichiro Iwata (Saitama Univ.), Kentaro Ikeda (Miyazaki Univ.), Hisashi Hata (Toyohashi Univ. of Tech.), Mami Kawaguchi (Gunma Univ.), Atsushi Iino (Tokyo Denki Univ.), Hisumi Takai (Yokohama National Univ.), Hiroshige Nakashima (GAIA System Solutions Inc.), Toshinobu Matsuba, Yu Yoshimura (Nagoya Univ.) CPSY2008-89 DC2008-80 |
This paper reports activities for Summer School on Embedded System Technologies 4 (SSEST4) held on September in 2008. SS... [more] |
CPSY2008-89 DC2008-80 pp.7-12 |
DC |
2008-12-12 15:15 |
Yamaguchi |
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Safety Analyses of Vehicle Control System Using Error Model Description Yu Yoshimura, Takahiro Hidaka, Takashi Kobayashi, Shigeharu Teshima (Nagoya Univ.), Naoya Chujo (TCRDL), Hiroaki Takada, Morio Takahama (Nagoya Univ.) DC2008-64 |
The increasing complexity of vehicle control systems raises costs
in design and validation of safety critical applicati... [more] |
DC2008-64 pp.27-32 |
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