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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-03 13:45 |
Kochi |
Kochi City Culture-Plaza |
A Yield Model with Testability and Repairability Yujiro Amano, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) VLD2009-54 DC2009-41 |
For deep-submicron technology, the increase in transitive and permanent faults of LSIs is a critical problem due to the ... [more] |
VLD2009-54 DC2009-41 pp.89-94 |
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