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Committee Date Time Place Paper Title / Authors Abstract Paper #
SCE 2013-10-02
13:35		 Miyagi Tohoku University, RIEC Stack size dependence of EM wave emission from Bi-2212 IJJs
Yukio Kotaki, Tsubasa Nishikata, Akira Kawakami, Takahiro Kato, Tsuneo Suzuki, Tadachika Nakayama, Kanji Yasui, Hisayuki Suematsu, Koichi Niihara (Nagaoka Univ. of Tech.) SCE2013-20		 We investigated oscillation characteristics of stacked Bi-2212 intrinsic Josephson junctions for various size （S=17×145~... [more] SCE2013-20
pp.7-12
ICD 2011-04-19
15:50		 Hyogo Kobe University Takigawa Memorial Hall Switching Mechanism of Perovskite-Oxide-Based Resistive Random Access Memory (ReRAM)
Akihiro Hanada (Tottori Univ.), Kentaro Kinoshita (Tottori Univ./TEDREC), Katsuhiko Matsubara, Takahiro Fukuhara (Tottori Univ.), Satoru Kishida (Tottori Univ./TEDREC) ICD2011-19		 We prepared resistive random access memory (ReRAM) structures of Al / Bi2Sr2CaCu2O8+δ (Bi-2212) bulk single crystal / Pt... [more] ICD2011-19
pp.105-109
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