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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD 2020-12-04
15:50
Online Online Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation
Hiroyuki Ueda, Shugo Kaji, Youngwoo Kim, Daisuke Fujimoto (NAIST), Taiki Kitazawa, Takashi Kasuga (NIT,Nagano College)), Yuichi Hayashi (NAIST) EMD2020-24
As the operating frequency of information devices increases, the noise generated by the device is also becoming broadban... [more] EMD2020-24
pp.34-38
EMCJ 2019-04-11
13:30
Okinawa Okinawa Industry Support Center A study on noise source modeling with voltage source for synchronous rectification DC-DC buck converter
Takaaki Ibuchi, Yuya Saito, Tsuyoshi Funaki (Osaka Univ.), Kazuma Kawai, Takahiro Tsuda (Denso) EMCJ2019-2
Small and high efficiency switching power supplies are widely demanded for many applications. However, fast switching op... [more] EMCJ2019-2
pp.7-12
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