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Committee Date Time Place Paper Title / Authors Abstract Paper #
MW 2023-12-21
14:55		 Shizuoka Shizuoka University (Hamamatsu Campus)
(Primary: On-site, Secondary: Online)		 Analysis of VNA Measurement Uncertainty and Development of Offset Lines Calibration Kit
Makoto Yoshida (CDEX), Yuki Kawahara (KMCO), Toshiyuki Yakabe (MPL) MW2023-149		 We have been working on the practical application of 28 GHz-band VNA based on six-port method (SPC-VNA), which is a kind... [more] MW2023-149
pp.2-7
AP
(2nd)		 2015-05-29
13:25		 Tokyo NICT Headquarters Experimental comparison of measurement accuracy caused by calibration method of network analyzer.(part 2)
Naoyuki Watanabe, Yoji Isota, Takayuki Sasamori, Teruo Tobana (Akita pref. Univ.) 		There are TRL calibration and SOLT calibration for the network analyzer calibration. Both calibrations are calibrated by... [more]
EMCJ, IEE-EMC, MW, EST [detail] 2014-10-23
13:50		 Akita Akita Prefectural Univ. Experimental comparison of measurement accuracy caused by calibration method of network analyzer.
Naoyuki Watanabe, Yoji Isota, Takayuki Sasamori, Teruo Tobana (Akita pref. Univ.) EMCJ2014-49 MW2014-105 EST2014-63		 There are TRL calibration and SOLT calibration for the network analyzer calibration. Both calibrations are calibrated by... [more] EMCJ2014-49 MW2014-105 EST2014-63
pp.41-44
AP
(2nd)		 2013-05-31
15:45		 Ehime Matsuyama Multi-Purpose Community Center A study of jig for S-parameter method using microstrip line Part 3
Takayuki Sasamori, Teruo Tobana, Yoji Isota (Akita Pref. Univ.) 		Recently, the S-parameter method using a vector network analyzer and a measurement jig instead of a balun has been propo... [more]
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