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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2011-02-14 11:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
An Analysis of Critical Paths for Field Testing with Process Variation Consideration Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushuu Univ) DC2010-61 |
Recently, it has the problem that good VLSIs in production testing become defective VLSIs in the fields because small de... [more] |
DC2010-61 pp.13-19 |
CPSY, DC (Joint) |
2009-08-04 - 2009-08-05 |
Miyagi |
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Exploratory evaluation of a clocking scheme with relaxed timing constraint Takanobu Kita (Univ. of Tokyo), Shou Tarui (Hitachi Ltd.), Ryota Shioya (Univ. of Tokyo/Research Fellowship for Young Scientists DC), Masahiro Goshima, Shuichi Sakai (Univ. of Tokyo) CPSY2009-20 |
The feature size of LSI is getting smaller year by year, increasing random variation between the elements. These days, t... [more] |
CPSY2009-20 pp.61-66 |
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