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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2011-02-14
11:00
Tokyo Kikai-Shinko-Kaikan Bldg. An Analysis of Critical Paths for Field Testing with Process Variation Consideration
Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushuu Univ) DC2010-61
Recently, it has the problem that good VLSIs in production testing become defective VLSIs in the fields because small de... [more] DC2010-61
pp.13-19
CPSY, DC
(Joint)
2009-08-04
- 2009-08-05
Miyagi   Exploratory evaluation of a clocking scheme with relaxed timing constraint
Takanobu Kita (Univ. of Tokyo), Shou Tarui (Hitachi Ltd.), Ryota Shioya (Univ. of Tokyo/Research Fellowship for Young Scientists DC), Masahiro Goshima, Shuichi Sakai (Univ. of Tokyo) CPSY2009-20
The feature size of LSI is getting smaller year by year, increasing random variation between the elements. These days, t... [more] CPSY2009-20
pp.61-66
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