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| Presentation | 2011-02-14 11:00 An Analysis of Critical Paths for Field Testing with Process Variation Consideration Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushuu Univ)  DC2010-61 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Recently, it has the problem that good VLSIs in production testing become defective VLSIs in the fields because small delays on signal lines are caused by aged deterioration. Some field test methods have been proposed to detect defects caused by aged deterioration. However, it is difficult to detect small delay faults comprehensively in field testing from the view point of test application time. Therefore, it is important to select target paths in field testing. A target path is defined as a delay fault –propagation path pair. Some methods to select as long paths as possible using SDQM and calculate aging degrade at the pass. have been proposed as target path selection. However, these methods do not consider process variation caused when VLSIs are manufactured. In this paper, we evaluate the number of dangerous paths which are not critical at design phase but become critical after manufacturing VLSIs as a stage before proposing a path selection method for field testing. Experimental results for ISCAS’89 and ITC’99 benchmark circuits show that there are 20 dangerous paths for 1000 VLSIs in the maximum. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | process variation / field test / transition delay fault model / critical paths / small delay / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 413, DC2010-61, pp. 13-19, Feb. 2011. | |
| Paper # | DC2010-61 | |
| Date of Issue | 2011-02-07 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2010-61 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2011-02-14 - 2011-02-14 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2011-02-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Analysis of Critical Paths for Field Testing with Process Variation Consideration |
| Sub Title (in English) | |
| Keyword(1) | process variation |
| Keyword(2) | field test |
| Keyword(3) | transition delay fault model |
| Keyword(4) | critical paths |
| Keyword(5) | small delay |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Satoshi Kashiwazaki |
| 1st Author's Affiliation | Nihon University (Nihon Univ) |
| 2nd Author's Name | Toshinori Hosokawa |
| 2nd Author's Affiliation | Nihon University (Nihon Univ) |
| 3rd Author's Name | Masayoshi Yoshimura |
| 3rd Author's Affiliation | Kyuushuu University (Kyushuu Univ) |
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| Speaker | Author-1 |
| Date Time | 2011-02-14 11:00:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2010-61 |
| Volume (vol) | vol.110 |
| Number (no) | no.413 |
| Page | pp.13-19 |
| #Pages | 7 |
| Date of Issue | 2011-02-07 (DC) |
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