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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SCE |
2019-01-23 13:30 |
Tokyo |
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Development of 30-GHz Datapath for Bit-Parallel, Gate-Level-Pipelined Rapid Single-Flux-Quantum Microprocessors Ikki Nagaoka (Nagoya Univ), Yuki Hatanaka (Mitsubishi Elec), Yuichi Matsui (Nagoya Univ), Koki Ishida (Kyushu Univ), Masamitsu Tanaka, Kyosuke Sano, Taro Yamashita (Nagoya Univ), Takatsugu Ono, Koji Inoue (Kyushu Univ), Akira Fujimaki (Nagoya Univ) SCE2018-30 |
We have started development of high-throughput single-flux-quantum (SFQ) microprocessors with the aim of higher throughp... [more] |
SCE2018-30 pp.29-34 |
SCE |
2017-08-09 14:35 |
Aichi |
Nagoya Univ. (Higashiyama Campus) |
Design of Component Circuits for Rapid Single-Flux-Quantum Gate-Level-Pipelined Microprocessors Yuki Hatanaka, Yuichi Matsui, Masamitsu Tanaka, Kyosuke Sano, Akira Fujimaki (Nagoya Univ.), Koki Ishida, Takatsugu Ono, Koji Inoue (Kyushu Univ.) SCE2017-17 |
We have started development of high-throughput rapid single-flux-quantum (RSFQ) microprocessors with the aim of higher p... [more] |
SCE2017-17 pp.37-42 |
VLD |
2015-03-04 10:20 |
Okinawa |
Okinawa Seinen Kaikan |
Optimization of sequential circuit in gate-level pipelined self-synchronous circuit design Atsushi Ito, Makoto Ikeda (The Univ. of Tokyo) VLD2014-177 |
With the down-scaling, circuit which has higher robustness is demanded. Dual-pipeline self synchronous circuit have inhe... [more] |
VLD2014-177 pp.135-140 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2014-11-28 10:05 |
Oita |
B-ConPlaza |
Optimization for gate-level pipelined self-synchrnous circuit Atsushi Ito, Makoto Ikeda (Univ. of Tokyo) VLD2014-107 DC2014-61 |
With the down-scaling, circuit which has higher robustness is demanded. Dual-pipeline self synchronous circuit have inhe... [more] |
VLD2014-107 DC2014-61 pp.233-238 |
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