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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 15:20 |
Ehime |
Ehime Prefecture Gender Equality Center |
A Generation Method of Easily Testable Functional k Time Expansion Model for a Transition Fault Model Using Controller Augmentation and Partial Scan Designs Yuta Ishiyama, Toshinori Hosokawa, Yuki Ikegaya (Nihon Univ.) VLD2019-43 DC2019-67 |
One of the challenges on VLSI testing is to reduce the area overhead and test application time of design-for-testability... [more] |
VLD2019-43 DC2019-67 pp.133-138 |
DC |
2018-02-20 11:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A test generation method based on k-cycle testing for finite state machines Yuya Kinoshita, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) DC2017-81 |
Recent advances in semiconductor technologies have resulted in VLSI circuit density and complexity. As a result, efficie... [more] |
DC2017-81 pp.25-30 |
DC |
2009-02-16 10:25 |
Tokyo |
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A test pattern generation method to reduce the number of detected untestable faults on scan testing Masayoshi Yoshimura (Kyusyu Univ.), Hiroshi Ogawa (Nihon Univ.), Yusyo Omori (Fujitsu Microelectronics), Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meizi Univ.) DC2008-69 |
Scan testing is one of the most popular test method fo VLSIs. In this test, only information of the circuit structure is... [more] |
DC2008-69 pp.7-12 |
DC |
2008-02-08 10:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Test Generation Method for Full Scan Circuit Using Multi Cycle Capture Test Yusho Omori, Hiroshi Ogawa, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.), Koji Yamazaki (Meiji Univ.) DC2007-70 |
Currently, scan testing is one of the most popular test methods for VLSIs. In this testing, only information of the circ... [more] |
DC2007-70 pp.19-24 |
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