IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 107, Number 385

Reliability

Workshop Date : 2007-12-14 / Issue Date : 2007-12-07

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Table of contents

R2007-54
*
Takeshi Natsume (Bubkyo Univ. GS), (Ehime Univ.), Kuniomi Nakamura (Former AIST), Yoshinobu Sato (Tokyo Univ. of Marine Science and Technology)
pp. 1 - 4

R2007-55
Reliability Evaluation and Analysis of Aluminum Electrolytic Capacitor
Katsuya Kumagai, Yusuke Kawahito (Epson), Tomoyuki Hirooka, Yoshiyuki Ihara (Kusumoto)
pp. 5 - 10

R2007-56
*
Yoshihisa Suzuki (Former Tokyo Metro. Inst. of Tech.)
pp. 11 - 14

R2007-57
Functional safety achieved by the safety-related system with safe trips
Hitoshi Muta, Koichi Suyama, Yoshinobu Sato (Tokyo Univ. of Marine Science and Technology)
pp. 15 - 18

R2007-58
*
Hiroyuki Ozawa, Hiroshi Mochizuki, Sei Takahashi, Hideo Nakamura (Nippon Univ.), Tsuyoshi Saito (JNIOSH)
pp. 19 - 22

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan