IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2008-02-15 / Issue Date : 2008-02-08

R2007-59
Development of Simple ESD Checker and it's Application -- Detection of ESD Checker and it's Application --
Norio Yamasaki, Masaru Sanada (KUT)
pp. 1 - 6

R2007-60
Reliability design and applications for the Non power supply type optical transmission unit
Yoshikazu Toba (Seikoh Giken), Kazuaki Wakai (ITEC)
pp. 7 - 12

R2007-61
Decomposition process of silicone and electrical contact failure -- Influence of silicone contamination on contact devices --
Terutaka Tamai (Mie Univ.), Yasuhiro Hattori, Hirosaka Ikeda (ANT)
pp. 13 - 18

R2007-62
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism -- 3-D oscillating mechanism for trial --
Shin-ichi Wada, Hiroshi Amao, Hiroto Minegishi, Keiji Koshida, Taketo Sonoda, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio Univ.)
pp. 19 - 24

R2007-63
Contact Resistance Characteristics of Tin Plated Contacts with Switching Operation and Surface Observation
Shinya Nakamura, Yuji Yamashita, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetwork)
pp. 25 - 30

R2007-64
Study of Behavior of Contact Resistance of Fretting Corrosion
Naoyuki Sato, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (AutoNetworks)
pp. 31 - 36

R2007-65
Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector
Yasutoshi Komatsu, Keiichi Inoue, Seiichi Onoda (Watanabe Co.,Ltd.,), Nobuo Tsukamoto (DSP Technology Associaetes, Inc.)
pp. 37 - 42

R2007-66
The investigation of the material for hermetic sealing -- About gas permeation of materials --
Tetsuo Hayase, Ichizo Sakamoto (OC.)
pp. 43 - 46

R2007-67
Reliability of Optical Connector Assembled with Instant Adhesive
Shuichi Yanagi, Shinsuke Matsui, Shigeru Hosono, Ryo Nagase (NTT)
pp. 47 - 52

R2007-68
[Special Talk] Holography and Its Application to Reliability Evaluation of the Electromechnical Devices
Masanari Taniguchi (Tohoku Bunka Gakuen University)
pp. 53 - 58

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan