IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Electromechanical Devices

Workshop Date : 2008-02-15 / Issue Date : 2008-02-08

EMD2007-114
Development of Simple ESD Checker and it's Application -- Detection of ESD Checker and it's Application --
Norio Yamasaki, Masaru Sanada (KUT)
pp. 1 - 6

EMD2007-115
Reliability design and applications for the Non power supply type optical transmission unit
Yoshikazu Toba (Seikoh Giken), Kazuaki Wakai (ITEC)
pp. 7 - 12

EMD2007-116
Decomposition process of silicone and electrical contact failure -- Influence of silicone contamination on contact devices --
Terutaka Tamai (Mie Univ.), Yasuhiro Hattori, Hirosaka Ikeda (ANT)
pp. 13 - 18

EMD2007-117
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism -- 3-D oscillating mechanism for trial --
Shin-ichi Wada, Hiroshi Amao, Hiroto Minegishi, Keiji Koshida, Taketo Sonoda, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio Univ.)
pp. 19 - 24

EMD2007-118
Contact Resistance Characteristics of Tin Plated Contacts with Switching Operation and Surface Observation
Shinya Nakamura, Yuji Yamashita, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetwork)
pp. 25 - 30

EMD2007-119
Study of Behavior of Contact Resistance of Fretting Corrosion
Naoyuki Sato, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (AutoNetworks)
pp. 31 - 36

EMD2007-120
Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector
Yasutoshi Komatsu, Keiichi Inoue, Seiichi Onoda (Watanabe Co.,Ltd.,), Nobuo Tsukamoto (DSP Technology Associaetes, Inc.)
pp. 37 - 42

EMD2007-121
The investigation of the material for hermetic sealing -- About gas permeation of materials --
Tetsuo Hayase, Ichizo Sakamoto (OC.)
pp. 43 - 46

EMD2007-122
Reliability of Optical Connector Assembled with Instant Adhesive
Shuichi Yanagi, Shinsuke Matsui, Shigeru Hosono, Ryo Nagase (NTT)
pp. 47 - 52

EMD2007-123
[Special Talk] Holography and Its Application to Reliability Evaluation of the Electromechnical Devices
Masanari Taniguchi (Tohoku Bunka Gakuen University)
pp. 53 - 58

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan