IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 108, Number 111

Component Parts and Materials

Workshop Date : 2008-06-27 / Issue Date : 2008-06-20

[PREV] [NEXT]

[TOP] | [2006] | [2007] | [2008] | [2009] | [2010] | [2011] | [2012] | [Japanese] / [English]

[PROGRAM] [BULK PDF DOWNLOAD]


Table of contents

CPM2008-30
Fabrication of Organic Light-Emitting Diodes Having Phosphorescent Layer of Vinyl Compounds
Eiji Otsuki (Tokyo Univ. Agricul. & Technol.), Akira Kawakami, Hiroshi Kita, Hideo Taka (Konica Minolta), Hiroaki Usui (Tokyo Univ. Agricul. & Technol.)
pp. 1 - 6

CPM2008-31
Optical Characteristics of Superstructure Silica Thin Films on LiNbO3 Substrates
Kei Kasahara, Takehiko Uno (Kanagawa Inst. Tech.)
pp. 7 - 12

CPM2008-32
Sliding of Charged Solitons on Polyacetylene
Yuhei Mori (NTT)
pp. 13 - 18

CPM2008-33
Supramolecular aggregation of gold nanoparticles by potential-controlled adsorption
Shin-ichiro Nakajima, Kazuhiko Yamada, Ken Onishi (JAE Industries, Ltd.)
pp. 19 - 24

CPM2008-34
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- for contact resistance --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio)
pp. 25 - 30

CPM2008-35
Discussion on the Relationship between Contact Resistance of Single Contact Spot and the Granularity of Emery paper
Hiroyuki Ishida, Shunsuke Sasaki, Shosuke Suzuki, Masanari Taniguchi, Tasuku Takagi (Tohoku Bunka Gakuen Univ.)
pp. 31 - 36

CPM2008-36
Inkjet printing of Ag nanoparticles on organic semiconductors for the application to organic transistors
Yoshiaki Noguchi, Tomoyuki Yokota, Tsuyoshi Sekitani, Takao Someya (The Univ. of Tokyo)
pp. 37 - 42

CPM2008-37
Evaluation of Contact Resistance between Organic Semiconductor and Conductive AFM probes for Potential Mapping
Yuki Sakai (Chiba Univ.), Yoshitaka Sugita, Takahito Suzuki, Masaki Tanemura (Nagoya Inst. Technol.), Yasuo Nakayama, Hisao Ishii, Masatoshi Sakai, Masakazu Nakamura, Kazuhiro Kudo (Chiba Univ.)
pp. 43 - 48

CPM2008-38
Friction Stir Spot Welding between Aluminum and Copper
Yousuke Takayashiki, Hajime Takada, Kazuhiro Murakami, Yoshihiko Watanabe (Yazaki)
pp. 49 - 51

CPM2008-39
Analysis of pentacene FET with ferroelectric gate insulator: effect of Source and Drain electrodes
Shuhei Yoshita, Ryosuke Tamura, Eunju Lim, Takaaki Manaka, Mitsumasa Iwamoto (Tokyo Tech)
pp. 53 - 57

CPM2008-40
Electrode metal dependence of carrier behavior in organic FET -- Direct observation using TRM-SHG --
Takaaki Manaka, Motoharu Nakao, Martin Weis, Fei Liu, Eunju Lim, Mitsumasa Iwamoto (Tokyo Tech)
pp. 59 - 64

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan