IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Knowledge-Based Software Engineering

Workshop Date : 2008-05-29 - 2008-05-30 / Issue Date : 2008-05-22

KBSE2008-1
On Rewriting Induction for Presburger-Constrained Term Rewriting Systems
Tsubasa Sakata, Naoki Nishida, Toshiki Sakabe, Masahiko Sakai, Keiichirou Kusakari (Nagoya Univ.)
pp. 1 - 6

KBSE2008-2
An Agent representing a learner for supporting online group works
Akane Mikami, Hiroshi Maruyama, Taichi Nakamura (TUT)
pp. 7 - 12

KBSE2008-3
Design and evaluation of the xfy MathML content markup editor and its user interface
Takayuki Kawata, Hiroshi Kai (Ehime Univ.), Yasushi Tamura (JustSystems Co.)
pp. 13 - 18

KBSE2008-4
Identifying Fault-Prone Tokens in Source Code Modules with Spam-Filtering Technique
Ryosuke Morii, Osamu Mizuno, Tohru Kikuno (Osaka Univ.)
pp. 19 - 24

KBSE2008-5
A Method to Identify Refactoring Opportunities in UML Models
Keishi Masuda, Norihiro Yoshida, Yuu Hamaguchi, Katsuro Inoue (Osaka Univ.)
pp. 25 - 30

KBSE2008-6
On the equivalence of intention dependency for i*
Shuichiro Yamamoto, Komon Ibe (NTT DATA)
pp. 31 - 34

KBSE2008-7
Method for Building feature expression dictionary to ReputationAnalysis
Hiroshi Maruyama, Kennshi Suzuki, Taichi Nakamura (TUT)
pp. 35 - 40

KBSE2008-8
An analysis for the causes of an unintelligible sentence and a proposal for an improvement support method
Takashi Sudou, Hiroshi Maruyama, Taichi Nakamura (TUT)
pp. 41 - 46

KBSE2008-9
Supporting tool for scenario generation using differential scenario
Masayuki Makino, Atsushi Ohnishi (Ritsumeikan Univ.)
pp. 47 - 52

KBSE2008-10
Pareto Principle on Source Code Change and Its Application to Project Steady-State Analysis
Keita Tanifuji, Hirohisa Aman (Ehime Univ.)
pp. 53 - 58

KBSE2008-11
Identifier Variation Analysis Using Code Clone as Template
Toshihiro Kamiya (AIST)
pp. 59 - 64

KBSE2008-12
Design and Implementation of the Software Maintenance Tool based on Code Clone Detection
Takanobu Yamashina, Hidetake Uwano, Kyohei Fushida, Yasutaka Kamei, Masataka Nagura, Shinji Kawaguchi, Hajimu Iida (NAIST)
pp. 65 - 70

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan