IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2009-11-20 / Issue Date : 2009-11-13

R2009-41
IStudy of contact trouble phenomenon with silicone
Makito Morii, Hiroyuki Moriwaki (OMRON)
pp. 1 - 5

R2009-42
A Study on Life-End Evaluation -- Step-Time Evaluation --
Sadanori Itou (Itoken office)
pp. 7 - 10

R2009-43
Emitter - metal - related degradation in InP-based HBTs and its suppression by introducing refractory metal
Yoshino K. Fukai, Kenji Kurishima, Norihide Kashio, Minoru Ida, Shoji Yamahata, Takatomo Enoki (NTT Corp.)
pp. 11 - 16

R2009-44
On an Optimal Maintenance Policy for Two-state POMDP Model with Multiple Observations
Kenichi Hayashi, Nobuyuki Tamura, Tetsushi Yuge, Shigeru Yanagi (N.D.A)
pp. 17 - 22

R2009-45
Change-Point Modeling with Environmental Factor for Software Reliability Assessment
Shinji Inoue, Shigeru Yamada (Tottori Univ.)
pp. 23 - 28

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan