IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Electromechanical Devices

Workshop Date : 2010-07-16 / Issue Date : 2010-07-09

EMD2010-17
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (13) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.)
pp. 1 - 6

EMD2010-18
Comparison of Magnetic Pulse Welding and Resistance Spot Welding for Flat Wires
Tomokatsu Aizawa, Keigo Okagawa (Tokyo Metropolitan College), Yuho Yoshida (Yokodai.JP)
pp. 7 - 12

EMD2010-19
Influence of transverse magnetic field on duration of break arcs occurring between Ag contacts in a DC circuit
Toru Sugiura, Junya Sekikawa (Shizuoka Univ.), Takayoshi Kubono (former Shizuoka Univ.)
pp. 13 - 18

EMD2010-20
A study of W based composite materials containing solid lubricants for sliding contacts
Yoshitada Watanabe, Masaomi Arai (Kogakuin Univ.)
pp. 19 - 24

EMD2010-21
ESD waveform measurement with current probe and optical voltage probe
Mikiya Iida (Toshiba Corp.)
pp. 25 - 30

EMD2010-22
Characteristics of Electric Field Coupling and Magnetic Field Couplings with Digital Circuit
Jianqing Wang, Tomohiro Taniguchi (Nagoya Inst. of Tech.)
pp. 31 - 36

EMD2010-23
Size Dependence of Return Ground Patterns on FM-Band Cross-Talks between Two Parallel Signal Traces on Printed Circuit Boards for Vehicles
Michihira Iida, Tsuyoshi Maeno (DENSO Corp.), Osamu Fujiwara (Nagoya Inst. of Tech.)
pp. 37 - 42

EMD2010-24
Proposal for Site Validation Method for GHz Range EMI Measurement Site (3) -- Site Attenuation in the Frequency Range from 1GHz to 6GHz by using Conical Dipole Antenna --
Atsuya Maeda, Jiro Kawano (VCCI), Hiroyuki Shimanoe, Masaru Sudo (FG EMC Lab. Ltd.), Noriyuki Mitsuzuka (Telecom Engineering Center)
pp. 43 - 48

EMD2010-25
Calibration of EMI Antennas for Microwave Frequency Bands by the Extrapolation Technique
Katsumi Fujii, Yukio Yamanaka (NICT)
pp. 49 - 54

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan