IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 111, Number 253

Reliability

Workshop Date : 2011-10-21 / Issue Date : 2011-10-14

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Table of contents

R2011-27
Advance Estimate of Accuracy of Predicting Normal State by using DB model for Fault Detection
Kohei Tanaka, Akemi Fujihara, Naoki Kimura, Yoshifumi Tsuge (Kyushu Univ.)
pp. 1 - 6

R2011-28
Estimation of Corrosion Rates for CUI in Petrochemical Plants using Case Database -- Reliability of Estimated corrosion rates --
Kentaro Yahiro, Sunghye Moon, Shigeyuki Tateno (Waseda Univ.), Hisayoshi Matusyama (Kyushu Univ.), Eiji Oshima (Tokyo Univ.)
pp. 7 - 12

R2011-29
Modeling and Optimization of Replacement Last in Reliability
Xufeng Zhao (Aichi Inst. of Tech.), Syouji Nakamura (Kinjo Gakuin Univ.), Toshio Nakagawa (Aichi Inst. of Tech.)
pp. 13 - 16

R2011-30
On Software Reliability Assessment with Multiple Change-Point Occurrence
Shinji Inoue, Shigeru Yamada (Tottori Univ.)
pp. 17 - 22

R2011-31
Hazard Rate Model Considering the Change of Requirements Specification for the Porting Phase of an Embedded OSS
Yoshinobu Tamura (Yamaguchi Univ.), Shigeru Yamada (Tottori Univ.)
pp. 23 - 28

R2011-32
On The Extended Cumulative Exposure Model, ECEM
Hideo Hirose, Takenori Sakumura (Kyushu Inst. of Tech.)
pp. 29 - 34

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan