IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2012-11-15 / Issue Date : 2012-11-08

R2012-60
Software Reliability Prediction by Neural Network with Software Development Data
Ryohei Shimada, Mitsuhiro Kimura (Hosei Univ.)
pp. 1 - 6

R2012-61
Software Reliability Analysis Based on Hierarchical Bayesian Weibull Models and Computational Inferences Using Common Knowledge Opinions
Toru Kaise (Univ. of Hyogo)
pp. 7 - 10

R2012-62
The screening method for insulation degradation of printed wiring boards
Hiroshi Kurokawa (Ryouden Kasei), Toshinari Matsuoka (Melco), Wataru Yagi (MCR)
pp. 11 - 16

R2012-63
A study of cracking mechanism by humidity and acceleration factor of PCT for MEMS thin film.
Etsuko Matsui, Taichi Nakao, Junichi Shintani (OMRON Co.)
pp. 17 - 21

R2012-64
A study on ignition and spreading fire of PWB by ceramic chip capacitors
Kojiro Iwatani, Kentaro Yanai, Satomi Manabe (Omron)
pp. 23 - 26

R2012-65
The safety and evaluation test of Lithium-Ion Secondary Battery
Manabu Okamoto, Hideki Kawai, Arata Okuyama, Yuichi Aoki (Espec Corp.)
pp. 27 - 30

R2012-66
*
Yutaka Ikemoto, Yasuyuki Komatsu (Qualtec)
pp. 31 - 35

R2012-67
A Studay on Evaluation for PWB
Sadanori Ito (itoken)
pp. 37 - 40

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan