IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 112, Number 371

Optoelectronics

Workshop Date : 2012-12-21 / Issue Date : 2012-12-14

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Table of contents

OPE2012-134
A short polarization converter using an embedded air-core waveguide
Junji Yamauchi, Takashi Hashimoto, Hisamatsu Nakano (Hosei Univ.)
pp. 1 - 6

OPE2012-135
High Isolation in Silicon Waveguide Optical Isolator Employing Nonreciprocal Phase Shift
Yuya Shirato, Yuya Shoji, Tetsuya Mizumoto (Tokyo Tech)
pp. 7 - 10

OPE2012-136
Silicon Waveguide Optical Circulator
Kota Mitsuya, Yuya Shoji, Tetsuya Mizumoto (Tokyo Tech.)
pp. 11 - 16

OPE2012-137
Investigation of Polarization-Independent Low-Power Consumption Silicon Optical Switch using Wire-Waveguide Directional Coupler
Toru Ushio, Kentaro Tsukamoto (Waseda Univ.), Yuichi Matsushima (GCS), Katsuyuki Utaka (Waseda Univ.)
pp. 17 - 20

OPE2012-138
Optical performance monitoring of silicon Mach-Zender modulator by monolithically integrated GePD
Hiroyuki Kusaka, Akira Oka, Kazuhiro Goi, Kensuke Ogawa (Fujikura), Tsung-Yang Liow, Xiaoguang Tu, Guo-Qiang Lo, Dim-Lee Kwong (IME)
pp. 21 - 26

OPE2012-139
Differential Optical Receivers with MSM Ge Photodetectors
Makoto Miura, Junichi Fujikata, Masataka Noguchi, Daisuke Okamoto (PETRA), Tsuyoshi Horikawa (AIST), Yasuhiko Arakawa (Univ. of Tokyo)
pp. 27 - 31

OPE2012-140
Nonlinear optical responses of impurities-doped silicon nanocrystals -- Enhancement of the nonlinear optical responses by Bi doping --
Kenji Imakita, Minoru Fujii, Shinji Hayashi (Kobe Univ.)
pp. 33 - 37

OPE2012-141
Characteristics of InP-based passive devices of Si substrate with BCB adhesive wafer bonding for on-chip interconnects
Jieun Lee, Yoshiaki Yamahara, Yuki Atsumi, Nobuhiko Nishiyama (TiTech), Shigehisa Arai (TiTech/QNERC)
pp. 39 - 44

OPE2012-142
Polarization-independent silica waveguide fabricated at low temperature.
Hidetaka Nishi, Tai Tsuchizawa (NTT), Hiroyuki Shinojima (Kurume Nat. College of Tech.), Toshifumi Watanabe, Sei-ichi Itabashi (NTT-AT), Rai Kou, Hiroshi Fukuda, Koji Yamada (NTT)
pp. 45 - 50

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan