Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2012] | [2013] | [2014] | [2015] | [2016] | [2017] | [2018] | [Japanese] / [English]
OME2015-42
[Invited Talk]
Probing Organic Interfaces using Sum-Frequency Generation Spectroscopy
Takayuki Miyamae (AIST)
pp. 1 - 5
OME2015-43
Fabrication of flexible organic transistors by ultrasonic welding
Tokuyuki Koh, Tatsuhiko Sasaki, Yota Yamazaki, Masatoshi Sakai, Yugo Okada, Hiroshi Yamauchi (Chiba Univ.), Yuichi Sadamitsu, Shoji Shinamura (Nippon Kayaku), Kazuhiro Kudo (Chiba Univ.)
pp. 7 - 10
OME2015-44
Optical characteristics of QLED with semiconductor quantum dot as emissive layer
Masatomo Hishinuma, Junya Maki, Takeshi Fukuda, Norihiko Kamata, Zentaro Honda (Saitama Univ.)
pp. 11 - 14
OME2015-45
Crystallinity Parameter of Electrosprayed-P3HT:PCBM Film Using Raman Specroscopy
Asuki Toda, Katsumi Suzuki, Kazuya Takahira, Takeshi Fukuda, Miru Hirahara, Norihiko Kamata, Zentaro Honda (Saitama Univ.)
pp. 15 - 18
OME2015-46
Thermoreflectance properties in OLEDs
Noriyuki Takada (AIST)
pp. 19 - 21
OME2015-47
Formation of Diamond Nanoparticle Thin Films by Electrophoretic Deposition
Yosuke Goto (Tokyo Univ. Agricul. & Technol.), Fujio Ohishi (Kanagawa Univ.), Kuniaki Tanaka, Hiroaki Usui (Tokyo Univ. Agricul. & Technol.)
pp. 23 - 28
OME2015-48
Selective probing of photo-induced electro-motive force in ITO/PEDOT:PSS/P3HT:PCBM/Al bulk-heterojunction organic solar cells by using electric-field-induced optical second-harmonic generation measurement
Kento Miwa, Dai Taguchi, Takaaki Manaka, Mitsumasa Iwamoto (Tokyo Tech)
pp. 29 - 34
OME2015-49
Two-dimensional distribution mapping of photovoltaic effect in double-layer organic solar cells
-- Electric field and photo-current distribution by axially polarized EFISHG microscope and LBIC measurement --
Tomoyasu Hirano (Tokyo Tech), Atsuo Sadakata (Kyushu Sangyo Univ.), Dai Taguchi, Takaaki Manaka, Mitsumasa Iwamoto (Tokyo Tech)
pp. 35 - 40
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.