Online edition: ISSN 2432-6380
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EMCJ2018-100
Results of EMC round robin test on emission and immunity test.
-- (3) Conducted immunity round robin test --
Yoshitsugu Okuda (KEC Electronic Industry Development Center), Yasushi Asaji (Murata Manufacturing), Takashi Usui (YAMAHA), Mikio Okumura (OMRON), Kazuhiro Kobayashi (IPS), Hiroyoshi Shida (Tokin EMC Engineering), Hisashi Ninomiya (Roland), Mitsuyoshi Maishima (Hamamatsu Photonics), Osami Wada (Kyoto Univ)
pp. 1 - 5
EMCJ2018-101
Improvement of Prediction Accuracy by Improving Parameters Extraction in 2-port Noise-source Equivalent Circuit Model of DC/DC Converter
Yuhei Osaki, Yusuke Yano, Taishi Uematsu, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.)
pp. 7 - 12
EMCJ2018-102
Study on moisture sensor for landslide monitoring Ⅱ
Shion Baba, Toshiyuki Tanaka, Noya Hirata, Tkahumi Fujimoto, Takahiro Hirano (Nagasaki Univ)
pp. 13 - 18
EMCJ2018-103
Internal Electric Field for Uniform Magnetic Field Exposure in Low Frequency and Intermediate Frequency Range
Katsuaki Aga, Akimasa Hirata (NITech)
pp. 19 - 24
EMCJ2018-104
Variation of estimation accuracy by difference between shape and heterogeneity of model for EEG brain wave source localization
Yuki Osachi, Takahiro Ito, Akimasa Hirata (NITech)
pp. 25 - 28
EMCJ2018-105
Study on Far-End Cross Talk reduction technology in Microstrip-line
-- Attached Capacitor Value --
Yoshiaki Mori, Sinichi Sasaki (Saga Univ)
pp. 29 - 34
EMCJ2018-106
Examination of reduction technique for radiation noise from the power supply layers in PCB
-- Evaluation by actual measurement --
Kazuki Fueta, Shinichi Sasaki (Saga Univ.)
pp. 35 - 38
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.