IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 118, Number 446

Reliability

Workshop Date : 2019-02-15 / Issue Date : 2019-02-08

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Table of contents

R2018-52
A Summary of 29th International Conference on Electrical Contacts and 64th IEEE Holm Conference on Electrical Contacts
Koichiro Sawa, Kiyoshi Yoshida, Takahiro Ueno (NIT), Kenji Suzuki (Fuji Electric)
pp. 1 - 6

R2018-53
Influence of width of magnets on shape of break arcs magnetically blown-out in a 500VDC/10A resistive circuit
Yuta Kaneko, Sekikawa Junya (Shizuoka Univ.)
pp. 7 - 12

R2018-54
Coming-back phenomenon of Arc Erosion Part to Sliding Surface on Commutator and Brush of DC Machines
Koivhiro Sawa, Yoshitada Watanabe, Takahiro Ueno (NIT)
pp. 13 - 18

R2018-55
Medium wave transmitting antenna impedance measurement method -- For improving system reliability --
Wataru Arita, Kazuma Shimizu, Kazuhiko Nozaki, Shunto Utsumi (NHK), Taishi Shirakubo, Fumiya Yano (NHK ITEC), Kyoko Kanamori, Masahiko Yamazoe (NHK)
pp. 19 - 24

R2018-56
[Invited Talk] SPICE based circuit performance degradation simulation with MOSFET aging models
Koji Tanaka, Shinichiro Amemiya, Hitoshi Okamura, Masanori Shimasue (MoDeCH)
pp. 25 - 30

R2018-57
[Invited Talk] Information System Construction which Balances Both Business Continuity and Security Incident Containment
Hajime Shimada (Nagoya Univ.)
p. 31

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan