IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 119, Number 82

Reliability

Workshop Date : 2019-06-14 / Issue Date : 2019-06-07

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Table of contents

R2019-9
Simultaneous and concentrated failure model and reliability
Tetsushi Yuge (NDA)
pp. 1 - 6

R2019-10
Analysis of a Markovian deteriorating system with decision of optimal degree of repair
Nobuyuki Tamura (Hosei Univ.)
pp. 7 - 12

R2019-11
Reliability modeling of advanced electron devices based on clustered defects and stress distribution
Shinji Yokogawa, Kyosuke Kunii (UEC)
pp. 13 - 18

R2019-12
Identification comparison of software fault-prone modules using nonlinear logistic regression models
Kazunari Yamanaka, Tadashi Dohi, Hiroyuki Okamura (Hiroshima U.)
pp. 19 - 24

R2019-13
Evaluation for the Algorithm of Minimum Cost-Flow Problem by Using Iterative Deepening Depth- First Search
Tomoaki Akiba (CIT), Natsumi Takahashi (AGU), Hisashi Yamamoto (TMU)
pp. 25 - 30

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan