IEICE Technical Report

Online edition: ISSN 2432-6380

Volume 121, Number 321

Infomation-Based Induction Sciences and Machine Learning

Workshop Date : 2022-01-17 - 2022-01-18 / Issue Date : 2022-01-10

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Table of contents

IBISML2021-18
Information Geometrically Generalized Covariate Shift Adaptation
Masanari Kimura (SOKENDAI), Hideitsu Hino (ISM/RIKEN)
pp. 1 - 8

IBISML2021-19
Constrained Bayesian Optimization through Optimal-value Entropy
Shion Takeno, Tomoyuki Tamura (NIT), Kazuki Shitara (Osaka Univ./JFCC), Masayuki Karasuyama (NIT)
pp. 9 - 16

IBISML2021-20
Automatic Makeup Transfer with GANs and Its Quantitative Evaluation
Cuilin Wang, Jun'ichi Takeuchi (Kyushu Univ.)
pp. 17 - 22

IBISML2021-21
Cluster approximation in quantum Boltzmann machine based on information geometry
Masaya Hoshikawa, Tomohiro Ogawa (UEC)
pp. 23 - 28

IBISML2021-22
CAMRI Loss: Class-wise Additive Angular Margin Loss for Improving Recall of a Specific Class
Daiki Nishiyama (Univ. Tsukuba), Fukuchi Kazuto, Yohei Akimoto, Jun Sakuma (Univ. Tsukuba/RIKEN)
pp. 29 - 36

IBISML2021-23
Local Explanation of Graph Neural Network through Predictive Graph Mining
Hinata Asahi, Masayuki Karasuyama (NIT)
pp. 37 - 44

IBISML2021-24
(See Japanese page.)
pp. 45 - 53

IBISML2021-25
More Powerful Selective Inference for K-means clustering with Application to Single Cell Analysis
Mizuki Sato, Yumehiro Omori, Yu Inatsu, Ichiro Takeuchi (NITech)
pp. 54 - 60

IBISML2021-26
Robustness to Adversarial Examples by Mixtures of L1 Regularazation Models
Hironobu Takenouchi, Junichi Takeuchi (Kyushu Univ.)
pp. 61 - 66

IBISML2021-27
Domain Adaptation with Optimal Transport for Extended Variable Space
Toshimitsu Atiake (ISM), Hideitsu Hino (ISM/RIKEN)
pp. 67 - 74

IBISML2021-28
Bayesian Optimization for Simultaneous Optimization of Multiple Tasks with Max-value Entropy Search
Rintaro Yamada, Shion Takeno, Masayuki Karasuyama (NIT)
pp. 75 - 80

IBISML2021-29
Determining the number of clusters using the shrinking maximum likelihood self-organizing map
Ryosuke Motegi, Yoichi Seki (Gunma Univ.)
pp. 81 - 87

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan