IEICE Technical Report

Online edition: ISSN 2432-6380

Volume 122, Number 203

Reliability

Workshop Date : 2022-10-07 / Issue Date : 2022-09-30

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Table of contents

R2022-32
A Note on Random Testing for Boundary Values
Xiujing Guo, Hiroyuki Okamura, Tadashi Dohi (Hiroshima University)
pp. 1 - 6

R2022-33
Optimal Two-phase Opportunity-based Age Replacement Policies in Discrete-time
Jing Wu (Hiroshima Univ.), Cunhua Qian (Nanjing Tech Univ.), Tadashi Dohi (Hiroshima Univ.)
pp. 7 - 12

R2022-34
Lifetime Analysis of Repairable Systems by Daubechies Wavelet
Jingchi Wu, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.)
pp. 13 - 18

R2022-35
A note on Polynomial Software Reliability Models
Siqiao Li, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.)
pp. 19 - 24

R2022-36
A Note on A Transformer Encoder-Based Malware Classification Using API Calls
Chen Li (Kyutech), Junjun Zheng (Osaka Univ.)
pp. 25 - 30

R2022-37
A Note on Pull-Type Security Patch Management Policies for Intrusion Tolerant Systems
Junjun Zheng (Osaka Univ.), Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
pp. 31 - 36

R2022-38
Bayesian ridge estimator based on vine copula-based priors
Hirofumi Michimae (Kitasato Univ.), Takeshi Emura (Kurume Univ.)
pp. 37 - 42

R2022-39
A Note on Hierarchical Modeling for Multi-State System
Hiroyuki Okamura (Hiroshima Univ.), Junjun Zheng (Osaka Univ.), Jiahao Zhang, Tadashi Dohi (Hiroshima Univ.)
pp. 43 - 47

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan