Online edition: ISSN 2432-6380
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OME2022-63
[Invited Lecture]
Interface potential distribution in GaN-HEMT using Laser Terahertz Emission Microscope
Noriyuki Takada (AIST)
pp. 1 - 3
OME2022-64
[Invited Talk]
Research trend of Tin based perovskite solar cell
-- From Lead free perovskite solar cell to all perovskite tandem solar cells --
Shuzi Hayase (UEC)
pp. 4 - 7
OME2022-65
Spray treatment technology for active layer deposition in perovskite solar cells
Issei Tanaka, Yusuke Ichino, Tatsuo Mori, Yoshiyuki Seike (Aichi Inst. Technol.)
pp. 8 - 11
OME2022-66
Study on Improvement of Film Quality of Perovskite Active Layers and It's Solar Cell Properties.
Yotaku Nakasima, Yusuke Ichino, Yoshiyuki Seike, Tatsuo Mori (Aichi Inst. Technol.)
pp. 12 - 15
OME2022-67
Annealing characteristics of CA/CuSCN dielectric mirror
Yuya Isogawa, Yusuke Ichino, Tastuo Mori, Yoshiyuki Seike (Aichi Inst.Tech.)
pp. 16 - 19
OME2022-68
[Invited Lecture]
Photophysical- and device property analysis of thermally activated delayed fluorescence materials based on precise kinetics
Youichi Tsuchiya, Chihaya Adachi (Kyushu Univ.)
pp. 20 - 25
OME2022-69
Fabrication of Cu2O films on flexible PET substrates for Bending Sensor Application
Ryosuke Nitta, Yuta Kubota, Nobuhiro Matsushita (Tokyo Tech)
pp. 26 - 30
OME2022-70
[Invited Lecture]
Additive material dependence on thermoelectric properties of PEDOT:PSS thin films
Naoki Kishi, Satoshi Hibi, Keisuke Ono, Kenta Kamiya, Yuya Yamamoto (Nagoya Inst. of Tech.)
pp. 31 - 33
OME2022-71
[Invited Talk]
Organic Solar Cells Entering A New Phase
Masahiro Hiramoto (IMS)
pp. 34 - 36
OME2022-72
[Invited Lecture]
Development of organic semiconductors with fluorobenzene derivatives and their application to thin film devices
Takeshi Yasuda (NIMS), Junpei Kuwabara, Takaki Kanbara (University of Tsukuba)
pp. 37 - 40
OME2022-73
[Invited Lecture]
Development of all printed polyimide capacitive-type humidity sensors with CNT gas-permeable transfer printed electrodes
Eiji Itoh, Jotaro Iguchi (Shinshu Univ.)
pp. 41 - 45
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.